Control marker for implementing analysis methods on spots
US11592442B2 · kind B2 · utility
1Cited by
3References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 12, 2021 |
| Grant date | Feb 28, 2023 |
| Priority date | — |
| Expiry date | Jan 17, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2458/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to the use of a control marker for implementing analysis methods on spots, in particular in the context of multiplex analyses. The present invention thus relates to solid supports containing said control marker, their preparation method and their use in analysis methods. The present invention makes it possible to verify the presence, location and/or integrity of the spots at the end of the analysis method, and thus to secure the obtained results while guaranteeing that the yielded result indeed results from a present, intact and localized spot.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.