Patent · US Active

Diamond probe hosting an atomic sized defect

US11592462B2 · kind B2 · utility

0Cited by

3References

10Claims

0Family size

Assignee

President and Fellows of Harvard College · US

Inventors

Xu Zhou · San Jose, US
Rainer Stöhr · Stuttgart, DE
Ling Xie · Beijing, CN
Amir Yacoby · Cambridge, US

Key dates

Filing date	Mar 13, 2018
Grant date	Feb 28, 2023
Priority date	—
Expiry date	Aug 9, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01Q60/38
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of manufacturing, characterizing, mounting, and a system of a probe may include a pillar having a taper angle and at least one engineered defect. The taper angle may be formed using crystallographic- or etching-based techniques. The probe may be mounted to an AFM chip. Furthermore, an RF waveguide may be connected to the AFM chip for providing RF excitation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.