Data interpretation quality control using data stacking
US11592588B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2020 |
| Grant date | Feb 28, 2023 |
| Priority date | — |
| Expiry date | Nov 20, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/74
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods, apparatuses, and computer-readable media utilize data stacking to facilitate identification and/or correction of data interpretation conducted for a subsurface formation. Related data sets, such as well logs, may be displayed along with markers representing a common entity in the related data sets, such as formation features in a surface formation, and a visualization of stacked data may be generated and centered on the markers to highlight mis-alignment of any of the markers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.