Efficient training and accuracy improvement of imaging based assay
US11593590B2 · kind B2 · utility
1Cited by
1References
49Claims
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Key dates
| Filing date | Nov 25, 2020 |
| Grant date | Feb 28, 2023 |
| Priority date | — |
| Expiry date | Nov 25, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30204
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to devices, apparatus and methods of improving the accuracy of image-based assay, that uses imaging system having uncertainties or deviations (imperfection) compared with an ideal imaging system. One aspect of the present invention is to add the monitoring marks on the sample holder, with at least one of their geometric and/optical properties of the monitoring marks under predetermined and known, and taking images of the sample with the monitoring marks, and train a machine learning model using the images with the monitoring mark.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.