Methods and systems for detection and isolation of bias in predictive models
US11593648B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2020 |
| Grant date | Feb 28, 2023 |
| Priority date | — |
| Expiry date | May 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This disclosure involves detecting biases in predictive models and the root cause of those biases. For example, a processing device receives test data and training data from a client device. The processing device identifies feature groups from the training data and the test data generates performance metrics and baseline metrics for a feature group. The processing device detects biases through a comparison of the performance metrics and the baseline metrics the feature group. The processing device then isolates a portion of the training data that corresponds to the detected bias. The processing device generates a model correction usable to remove the bias from the predictive model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.