Patent · US Active

Specimen processing systems and related methods

US11593934B2 · kind B2 · utility

0Cited by
3References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 24, 2020
Grant dateFeb 28, 2023
Priority date
Expiry dateSep 23, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V2201/03
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A specimen processing system includes a plate for supporting a specimen system, wherein the specimen system includes a container and a specimen contained therein. The specimen processing system further includes a camera disposed above the plate and configured to generate images of the specimen system, a light source disposed beneath the plate for radiating light towards the plate, a light stop for blocking a portion of the light from reaching the specimen system to produce darkfield illumination of the specimen at the camera, and one or more processors electronically coupled to the camera and configured to track a position of the specimen within the specimen container during a specimen processing protocol based on the images.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.