Method and device for superresolution optical measurement using singular optics
US11598630B2 · kind B2 · utility
2Cited by
11References
6Claims
0Family size
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Key dates
| Filing date | Jan 31, 2022 |
| Grant date | Mar 7, 2023 |
| Priority date | — |
| Expiry date | Jan 31, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous object on a sample. A sequence of at least two compact luminous distributions of different topological families is projected onto the sample, and light re-emitted by the at least one luminous object is detected. At least one optical image is generated for each luminous distribution on the basis of the light detected. The optical images are analyzed to obtain spatiotemporal information regarding the light re-emitted by the at least one luminous object, or location of the at least one luminous object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.