Techniques for evaluating analytical instrument performance
US11598755B2 · kind B2 · utility
0Cited by
1References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 20, 2019 |
| Grant date | Mar 7, 2023 |
| Priority date | — |
| Expiry date | Sep 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2030/889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques and apparatus for evaluating analytical device performance and data quality are described. In one embodiment, for example, an apparatus may include at least one memory, and logic coupled to the at least one memory. The logic may be configured to generate an analysis method to be performed by an analytical device, the analysis method comprising a plurality of method segments comprising at least one performance assessment process and at least one sample analysis process, and link the at least one performance assessment process with the at least one sample analysis process. Other embodiments are described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.