Method for manufacturing system analysis and/or maintenance
US11598801B2 · kind B2 · utility
2Cited by
2References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 2, 2022 |
| Grant date | Mar 7, 2023 |
| Priority date | — |
| Expiry date | Aug 2, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2223/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for factory analysis and/or maintenance, preferably including receiving factory information and/or associating defects with factory components, and optionally including acting based on defect associations and/or operating factory machines. The method is preferably associated with one or more manufacturing systems and/or elements thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.