Method and system for data driven machine diagnostics
US11599103B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Feb 21, 2019 |
| Grant date | Mar 7, 2023 |
| Priority date | — |
| Expiry date | Jan 7, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for data driven diagnostics of a machine including a machine learning model instantiated in a computer, the machine learning model being configured to: receive operational data of the machine; and process the operational data to determine machine diagnostics information. The machine learning model is trained using simulated defect information received from a simulation environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.