Patent · US Active

Generation of realistic mock data

US11599517B2 · kind B2 · utility

0Cited by

1References

20Claims

0Family size

Assignee

SAP SE · DE

Inventors

Jan Portisch · Bruchsal, DE
Volker Saggau · Bensheim, DE
Sandra Bracholdt · Dielheim, DE

Key dates

Filing date	Jul 2, 2020
Grant date	Mar 7, 2023
Priority date	—
Expiry date	Mar 25, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG06F16/2272
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A variety of scenarios for generating mock data based on original data are described. Characteristics of the original data can be reflected in the mock data without having access to the actual original data. Instead, statistical artifacts representing the original data can be used to instantiate reconstructed database tables. In relational database scenarios, foreign key relationships can be preserved even if the actual values are not known. The reconstructed database tables can be used as mock data in a variety of circumstances, including testing, and is especially useful to recreate characteristics of the original data when the original data cannot be made available for size, confidentiality, or privacy reasons.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.