Security information extraction and probe insertion for side-channel analysis
US11599633B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 2021 |
| Grant date | Mar 7, 2023 |
| Priority date | — |
| Expiry date | Feb 12, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY04S40/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, machine readable media and systems for performing side channel analysis are described. In one embodiment, a method can determine, from a gate level representation of a circuit in a layout on a die of an IC, a first set of paths through the circuit that process security related data during operation of the circuit, the circuit including a second set of paths that do not process security related data; and the method can further determine, in a simulation of power consumption in the first set of paths but not the second set of paths, power consumption values in the first set of paths to determine potential security leakage of the security related data in the circuit. The method can further determine, from the power consumption values, positions in the layout for inserting virtual probes on the die for use in measuring security metrics that indicate potential leakage of the security related data. The insertion of the virtual probes is relative to the actual simulated layout of the die. Other methods, machine readable media and systems are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.