Fast industrial computed tomography for large objects
US11604152B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2020 |
| Grant date | Mar 14, 2023 |
| Priority date | — |
| Expiry date | Feb 25, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10072
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for computed tomography inspection can include a stage, a stationary radiation source, a stationary radiation detector, and a controller. The stage can secure a target thereon and rotate about a rotation axis. The radiation source can emit a beam of penetrating radiation from a focal point that is directed upon a portion of the target. The radiation detector can include a sensing face configured to acquire measurements of radiation beam intensity incident thereon as a function of position. The controller can command the stage to translate from a first position to a second position in a direction transverse to a central axis of the radiation beam. A magnification of the target at the first and second positions can be approximately equal. The stage does not translate transverse to the central axis of the radiation beam during measurement of the radiation beam intensity by the detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.