Enhanced sample imaging using structured illumination microscopy
US11604341B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 2020 |
| Grant date | Mar 14, 2023 |
| Priority date | — |
| Expiry date | Dec 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0675
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.