Neural network error contour generation circuit
US11604996B2 · kind B2 · utility
0Cited by
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10Claims
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Key dates
| Filing date | Apr 26, 2019 |
| Grant date | Mar 14, 2023 |
| Priority date | — |
| Expiry date | Nov 8, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/045
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A neural network learning mechanism has a device which perturbs analog neurons to measure an error which results from perturbations at different points within the neural network and modifies weights and biases to converge to a target.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.