Framework for processing machine learning model metrics
US11605012B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2020 |
| Grant date | Mar 14, 2023 |
| Priority date | — |
| Expiry date | Apr 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/88
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method including extracting, from an input, supported data. The input includes outputs from machine learning models in different formats. The supported data includes a subset of the input after data normalization. The method also includes inferring, from the supported data, data types to be used with respect to generating metrics for the machine learning models. The method also includes generating, from the supported data and using the data types, a relational event including the supported data. The relational event further includes a first data structure object including the types and having a first data structure different than the different formats. The method also includes calculating, using the supported data in the first data structure, the metrics for the machine learning models. The method also includes generating, from the relational event, a monitoring event. The monitoring event includes a second data structure object segmented into data buckets storing the metrics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.