Patent · US Active

Qualification process for cryo-electron microscopy samples as well as related sample holder

US11609171B2 · kind B2 · utility

0Cited by

28References

5Claims

0Family size

Assignee

Xtal Concepts GmbH · DE

Inventors

Annette Eckhardt · Hamburg, DE
Arne Meyer · Hamburg, DE
Karsten Dierks · Wieren, DE

Key dates

Filing date	May 14, 2020
Grant date	Mar 21, 2023
Priority date	—
Expiry date	Apr 21, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/3103
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A qualification process for a sample to be examined by means of cryo-electron microscopy. The, sample (12) is applied to a sample carrier (10) provided for cryo-electron microscopy and subsequently the sample (12) arranged on the sample carrier is examined by means of dynamic light scattering. The particle size distribution within the sample (12) is determined by means of the dynamic light scattering. Further, a sample holder designed to carry out the qualification process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.