Glitch detector

US11609600B2 · kind B2 · utility

Assignee

• NXP USA, Inc. · US

Inventors

• Rohit Kumar Sinha · Noida, IN
• Garima Sharda · Ghaziabad, IN
• Vandana Sapra · Rohini, IN
• Amol Agarwal · Noida, IN
• Stefan Doll · Obermoschel, DE
• Andreas Lentz · Buchholz, DE

Key dates

• Filing date: Jul 22, 2022
• Grant date: Mar 21, 2023
• Expiry date: Jul 22, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F1/12
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A glitch detector includes a metastability detector circuit, a reference storage circuit, and a pattern comparison circuit. The metastability detector circuit is configured to generate state signals at each cycle of the clock signal. The reference storage circuit is configured to store a logic state of each state signal based on a delayed version of the clock signal, and generate reference signals. A logic state of each reference signal is equal to a logic state of a corresponding state signal generated during a previous cycle of the clock signal. The pattern comparison circuit is configured to receive the state signals generated during a current cycle of the clock signal, the reference signals, and first and second values, and generate clock and voltage glitch signals based on first and second patterns that are associated with the state signals generated during the current cycle and the reference signals, respectively.