System for simultaneously and microscopically measuring vapor cell coating film energy transfer and relaxation characteristics at nanometer scales

US11614464B2 · kind B2 · utility

Assignee

• NORTH UNIVERSITY OF CHINA · CN

Inventors

• Zongmin Ma · Taiyuan, CN
• Jun Liu · Shanghai, CN
• Jun Tang · Beijing, CN
• Yunbo Shi · Taiyuan, CN
• Xiaoming Zhang · Beijing, CN
• Hao Guo · Taiyuan, CN
• Huanfei Wen · Taiyuan, CN
• Cheng Jie Dong · Sunnyvale, US
• Jiuyan Wei · Taiyuan, CN

Key dates

• Filing date: Dec 9, 2021
• Grant date: Mar 28, 2023
• Expiry date: Dec 9, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N21/84
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system for simultaneously and microscopically measuring vapor cell coating film energy transfer and relaxation characteristics at nanometer scales includes a space relaxation characteristic detection unit which includes a laser, an optical isolator, a spatial light filter, a reflector, a Glan-Taylor polarizer, a first quarter-wave plate, a spatial light modulator, a focusing lens, a second quarter-wave plate, a polarizing film, a PD detection unit, an I/V amplification unit, a data acquisition unit, a spectroscope and an optical chopper, an atomic force microscope detection unit for energy transfer micro-areas, a shielding cylinder, a coated alkali metal atomic vapor cell, a data processing unit and a magnetic field controlled coil. The energy transfer micro-area detection unit includes coated samples, a probe, an oscillator, a laser, a four-quadrant photoelectric detection unit, a band-pass filter unit, an automatic gain controller, an adder, a piezoelectric scanning cylinder, a sample table and a PI controller.