Charged particle scanners
US11614552B2 · kind B2 · utility
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17References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 20, 2020 |
| Grant date | Mar 28, 2023 |
| Priority date | — |
| Expiry date | Sep 5, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05H2277/1405
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.