Patent · US Active

Level measuring instrument with radar system on chip

US11619537B2 · kind B2 · utility

0Cited by

3References

9Claims

0Family size

Assignee

VEGA Grieshaber KG · DE

Inventors

Roland Welle · Oberwolfach, DE
Joerg Boersig · Schapbach, DE
Steffen Waelde · Niedereschach, DE

Key dates

Filing date	Oct 6, 2017
Grant date	Apr 4, 2023
Priority date	—
Expiry date	May 25, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01S13/88
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A level measuring instrument is provided, including a microwave integrated circuit in a form of a radar system on chip with several transmission channels, each configured to generate a high-frequency transmission signal, and one or more receiving channels, each configured to receive reflected signals from a product surface; a noise level reduction device configured to increase a signal-to-noise ratio of a received signal, which relates to the reflected signals from the product surface, by averaging results of several measurements carried out in succession in time; and/or a signal level increasing device configured to combine two of the several transmission channels to produce a combined transmission signal with increased power and/or to combine two of the receiving channels to produce a combined reception signal with increased power. A method for measuring a level of a medium in a container or a surface topology of the medium is also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.