Mass spectrometry of surface contamination
US11621153B2 · kind B2 · utility
1Cited by
0References
12Claims
0Family size
Inventors
Key dates
| Filing date | Jun 7, 2021 |
| Grant date | Apr 4, 2023 |
| Priority date | — |
| Expiry date | Jul 17, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/16
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A system for sampling and analysis of the chemical composition of any material from any surface is provided. The system comprises of a sniffing line to collect a specimen from a surface for evaluation and a thermal desorption system to thermally desorb an analyte from the sampled material, The system may further comprise of an ionization system to form an ionized analyte. A mass spectrometer is then used to analyze the chemical composition of the ionized analyte sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.