Analog-to-digital converter system using reference analog-to-digital converter with sampling point shifting and associated calibration method
US11621718B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 21, 2021 |
| Grant date | Apr 4, 2023 |
| Priority date | — |
| Expiry date | Jul 21, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1215
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An analog-to-digital converter (ADC) system includes a main ADC, a reference ADC, a sampling control circuit, and a calibration circuit. The main ADC obtains a first sampled input voltage by sampling an analog input according to a first sampling clock, and performs analog-to-digital conversion upon the first sampled voltage to generate a first sample value. The reference ADC obtains a second sampled voltage by sampling the analog input according to a second sampling clock, and performs analog-to-digital conversion upon the second sampled voltage to generate a second sample value. The sampling control circuit controls the second sampling clock to ensure that the second sampling clock and the first sampling clock have a same frequency but different phases, and adjusts the second sample value to generate a reference sample value. The calibration circuit applies calibration to the main ADC according to the first sample value and the reference sample value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.