Fast image acquisition system and method using pulsed light illumination and sample scanning to capture optical micrographs with sub-micron features
US11624710B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 24, 2019 |
| Grant date | Apr 11, 2023 |
| Priority date | — |
| Expiry date | Jan 11, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/102
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical inspection system for detecting sub-micron features on a sample component. The system may have a controller, a camera responsive to the controller for capturing images, an objective lens able to capture submicron scale features on the sample component, and a pulsed light source. The pulsed light source may be used to generate light pulses. The camera may be controlled to acquire images, using the objective lens, only while the pulsed light source is providing light pulses illuminating a portion of the sample component. Relative movement between the sample component and the objective lens is provided to enable at least one of a desired subportion or an entirety of the sample component to be scanned with the camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.