Self-calibrating and directional focusing systems and methods for infinity corrected microscopes
US11624901B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 6, 2021 |
| Grant date | Apr 11, 2023 |
| Priority date | — |
| Expiry date | Jul 6, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B7/38
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method and system for autofocusing an objective lens in a microscope system are disclosed. A decentered aperture is disposed in an optical path between an objective lens and an image plane of an image capturing device and a plurality of reference images are captured. Each reference image is captured when the objective lens is positioned at a corresponding z-position of a plurality of z-positions along an axis of travel of the objective lens and the optical path is at least partially occluded by the decentered aperture. At least one reference image of the plurality of the reference images is associated with a best focus position. The plurality of reference images are analyzed to develop a plurality of pattern locations, wherein each pattern location represents a position of a pattern formed on the image plane when a corresponding reference image was captured. The objective lens is positioned in accordance with the best focus position and the plurality of pattern locations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.