Patent · US Active

Custom photolithography masking via precision dispense process

US11626286B1 · kind B1 · utility

0Cited by
0References
12Claims
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Assignee

Inventors

Key dates

Filing dateAug 25, 2020
Grant dateApr 11, 2023
Priority date
Expiry dateJul 17, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F9/00
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Systems and methods for custom photolithography masking via a precision dispense apparatus and process are disclosed. Methods include creating a toolpath instruction for depositing opaque onto a substrate, programming a precision dispense apparatus to execute the created toolpath instruction, and causing the precision dispense tool to deposit opaque material onto the substrate to form the photomask. The substrate may be an optically transparent plate or film or may be an electronic substrate where the opaque material is deposited directly onto a photoresist coating. Capabilities of the systems and methods disclosed herein extend to 3D substrates and custom photolithography masking, among others.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.