Test arrangement for adjusting a setup of testing a device under test, a method of operating the test arrangement, and a non-transitory computer-readable recording medium
US11630146B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 1, 2022 |
| Grant date | Apr 18, 2023 |
| Priority date | — |
| Expiry date | Mar 1, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test arrangement for adjusting a setup of testing a device under test (DUT) includes a main device that generates an RF signal and processes an incoming RF signal in a first frequency range; a frontend component generates an RF signal and processes an incoming RF signal in a second frequency range. The frontend component measures a signal level in a sub-range within the first frequency range; a connection cable connects the main device with the frontend component; and an analyzer predicts a behavior of the connection cable in a rest portion of the first frequency range that is different from the sub-range within the first frequency range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.