Feature inspection system
US11631184B2 · kind B2 · utility
0Cited by
11References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2020 |
| Grant date | Apr 18, 2023 |
| Priority date | — |
| Expiry date | Jul 7, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10032
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.