System and method for occlusion correction
US11631235B2 · kind B2 · utility
10Cited by
0References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 21, 2022 |
| Grant date | Apr 18, 2023 |
| Priority date | — |
| Expiry date | Jul 21, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30184
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In variants, the method for occlusion correction can include: determining a measurement depicting an occluded object of interest (OOI), optionally infilling the occluded portion of the object of interest within the measurement, and determining an attribute of the object of interest based on the infilled measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.