Patent · US Active

CMP polishing pad with uniform window

US11633830B2 · kind B2 · utility

1Cited by
6References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 24, 2020
Grant dateApr 25, 2023
Priority date
Expiry dateMay 21, 2041

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/042
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad useful in chemical mechanical polishing comprising a polishing portion having a top polishing surface and comprising a polishing material an opening through the polishing pad, and a transparent window within the opening in the polishing pad, the transparent window being secured to the polishing pad and being transparent to at least one of magnetic and optical signals, the transparent window having a thickness and a top surface having a plurality of elements separated by interconnected recesses to provide a pattern in the top surface that includes recesses for improved deflection into a cavity in the polishing pad during polishing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.