Traceable in-situ micro- and nano-indentation testing instrument and method under variable temperature conditions

US11635361B2 · kind B2 · utility

Assignee

• JILIN UNIVERSITY · CN

Inventors

• Hongwei Zhao · Qinhuangdao City, CN
• Zhaoxin Wang · Changchun, CN
• Jianhai Zhang · Shenyang, CN
• Peng Liu · San Diego, US
• Shunbo Wang · Jilin, CN
• Cong Li · Shanghai, CN
• Xiangyu Zong · Changchun, CN
• Shuilong Zhou · Changchun, CN
• Honglong Li · Luohe City, CN
• Jiru Wang · Hangzhou City, CN
• Meng Zhang · 安丰镇, CN
• Wenyang Wang · Changchun, CN

Key dates

• Filing date: Jul 14, 2021
• Grant date: Apr 25, 2023
• Expiry date: Dec 22, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2203/0647
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present disclosure relates to a traceable in-situ micro- and nano-indentation testing instrument and method under variable temperature conditions. A macro-micro switchable mechanical loading module, a nano mechanical loading module and an indentation position optical positioning module are fixed on a gantry beam, an optical imaging axis of an optical microscopic in-situ observation or alignment module and a loading axis of the nano mechanical loading module are coplanar, the optical microscopic in-situ observation or alignment module and the function switchable module are mounted on a table top of a marble pedestal, and a contact or ambient mixed variable temperature module is fixedly mounted on the function switchable module. A modular design is adopted, the micro- and nano-indentation testing instrument is used as a core, in combination with a multi-stage vacuum or ambient chamber, an indentation depth traceability calibration module and multiple sets of optical microscopic imaging assemblies.