Sensing using inverse multiple scattering with phaseless measurements
US11635394B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 10, 2020 |
| Grant date | Apr 25, 2023 |
| Priority date | — |
| Expiry date | Aug 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/405
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A permittivity sensor, for determining an image of a distribution of permittivity of a material of an object in a scene, comprising an input interface, a hardware processor, and an output interface is provided. The input interface is configured to accept phaseless measurements of propagation of a known incident field through the scene and scattered by the material of the object in the scene. The hardware processor is configured to solve a multi-variable minimization problem over unknown phases of the phaseless measurements and unknown image of the permittivity of the material of the object by minimizing a difference of a nonlinear function of the known incident field and the unknown image with a product of known magnitudes of the phaseless measurements and the unknown phases. Further, the output interface is configured to render the permittivity of the material of the object provided by the solution of the multi-variable minimization problem.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.