Patent · US Active

Data analysis apparatus, data analysis method, and data analysis program

US11636358B2 · kind B2 · utility

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12Claims
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Key dates

Filing dateMay 18, 2020
Grant dateApr 25, 2023
Priority date
Expiry dateMay 5, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N20/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A data analysis apparatus executes: a selection process selecting a first feature variable group that is a trivial feature variable group contributing to prediction and a second feature data group other than the first feature variable group from a set of feature variables; an operation process operating a first regularization coefficient related to a first weight parameter group corresponding to the first feature variable group in a manner that the loss function is larger, and operating a second regularization coefficient related to a second weight parameter group corresponding to the second feature variable group in a manner that the loss function is smaller, among a set of weight parameters configuring a prediction model, in a loss function related to a difference between a prediction result output in a case of inputting the set of feature variables to the prediction model and ground truth data corresponding to the feature variables.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.