Method and apparatus for identifying key point locations in image, and medium
US11636666B2 · kind B2 · utility
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17Claims
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Key dates
| Filing date | Mar 25, 2021 |
| Grant date | Apr 25, 2023 |
| Priority date | — |
| Expiry date | Apr 8, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/82
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure provides a method for identifying key point locations in an image. The method includes: obtaining an image to be detected, and obtaining a feature map and a saliency map of the image to be detected; generating a score response map of the image to be detected based on the feature map of the image to be detected; obtaining a first key point location of a key point on the score response map; obtaining a second key point location of the key point mapped on the image to be detected based on the first key point location; and correcting the second key point location based on the saliency map.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.