Impedance spectrum in-situ measurement device and method for dielectric constant of solid material, at high temperature and high pressure conditions
US11644433B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2022 |
| Grant date | May 9, 2023 |
| Priority date | — |
| Expiry date | Jan 18, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/026
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention discloses an impedance spectrum in-situ measuring device for the dielectric constant of solid materials at high temperature and high pressure conditions. The device comprises a cube-shaped pyrophyllite, a cylindrical opening penetrates between one end face of the pyrophyllite and the other end face opposite to the end face; a heater formed by sleeving annular stainless steel sheets is arranged in the opening; a first plate-shaped platinum electrode and a second plate-shaped platinum electrode are arranged in the cavity of the innermost ring-shaped stainless steel sheet. The first plate-shaped platinum electrode is electrically connected with one end of the Solartron 1260 Impedance/Gainphase Analyzer through a first lead, and the second plate-shaped platinum electrode is electrically connected with the other end of the Solartron 1260 Impedance/Gainphase Analyzer through a second lead. Several layers of machinable alumina fillers are filled between the sample of the solid material to be measured and the innermost annular stainless steel sheet. The device also comprises a first cylindrical plug and a second cylindrical plug. The device can be considered as a useful tool …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.