Patent · US Active

Quantum-dot-based measuring system and method

US11644479B2 · kind B2 · utility

0Cited by

0References

13Claims

0Family size

Assignee

SHANGHAI UNIVERSITY · CN

Inventors

Na Chen · Shanghai, CN
Shaoying Li · Shanghai, CN
Tingyun Wang · Shanghai, CN
Zhenyi Chen · Shanghai, CN
Shupeng Liu · Shanghai, CN

Key dates

Filing date	Jun 7, 2021
Grant date	May 9, 2023
Priority date	—
Expiry date	Jul 15, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01Q70/18
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A quantum-dot-based measuring system is disclosed. The quantum-dot-based measuring system includes a laser to emit excitation light, an optical fiber probe including a tail end and a tapered tip, and the tapered tip of the optical fiber probe is attached with one or more quantum dots, and the excitation light is injected from the tail end of the optical fiber probe and emitted from the tapered tip to a sample to be detected, an objective lens to collect optical signal reflected by the sample and a spectrometer to receive the optical signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.