Capturing a misalignment
US11645767B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 11, 2020 |
| Grant date | May 9, 2023 |
| Priority date | — |
| Expiry date | Jan 7, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and method for providing misaligned image features. A method includes receiving a first and a second image data set, wherein the first and the second image data sets map at least partially a shared examination region of an examination object, registering the first image data set with the second image data set, determining a distance data set based on the registered first image data set and the second image data set, identifying the misaligned image features in the distance data set that are caused by a misalignment between the registered first and the second image data sets, and providing the identified misaligned image features.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.