Patent · US Active

Plasma processing apparatus and plasma processing method

US11646179B2 · kind B2 · utility

0Cited by
65References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 2021
Grant dateMay 9, 2023
Priority date
Expiry dateJun 1, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32798
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus includes a chamber providing a space for processing a substrate, a substrate stage configured to support the substrate within the chamber and including a lower electrode, an upper electrode facing the lower electrode, a focus ring in or on an upper peripheral region of the substrate stage to surround the substrate, and a plasma adjustment assembly in at least one of a first position between the upper electrode and the lower electrode and a second position between the focus ring and the lower electrode, the plasma adjustment assembly including a photoreactive material layer and a plurality of light sources configured to irradiate light onto a local region of the photoreactive material layer. A capacitance of the local region is changed as the light is irradiated to the local region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.