Patent · US Active

Method and diagnostic examination device for estimating an examination duration that is tolerable by a patient

US11647918B2 · kind B2 · utility

0Cited by

0References

16Claims

0Family size

Assignee

Siemens Healtchare GmbH

Inventors

David Grodzki · Erlangen, DE
Hans Weber · Glückstadt, DE

Key dates

Filing date	Jun 21, 2019
Grant date	May 16, 2023
Priority date	—
Expiry date	Nov 5, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/56
WIPO fieldMedical technology
WIPO sectorInstruments

Abstract

In a method and apparatus for determining an examination duration tolerable by a patient in and/or on a diagnostic examination device, the patient to be examined is observed at least in a preliminary stage of the examination concerned, during which measurement parameters are ascertained. From the measurement parameters, an algorithm determines a statement about the dwell capability of the patient in the examination device. The algorithm can be an artificial neural network.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.