Temperature probe with improved response time
US11650106B2 · kind B2 · utility
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16References
20Claims
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Key dates
| Filing date | Dec 30, 2020 |
| Grant date | May 16, 2023 |
| Priority date | — |
| Expiry date | Aug 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space therein. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperature. The insert, which is formed of silicon carbide, is operably interposed between the sidewall and the temperature-sensitive element. A method of manufacturing a temperature probe is also provided. A temperature sensing system employing a temperature probe is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.