Patent · US Active

Specimen inspection machine and operation method thereof

US11650146B2 · kind B2 · utility

0Cited by
1References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 21, 2020
Grant dateMay 16, 2023
Priority date
Expiry dateMay 26, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/8867
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A specimen inspection machine includes a case, a carrying device, an inspection device, a sensing device and a control device. The carrying device is disposed in the case. The inspection device is disposed on the carrying device. The inspection device has accommodating grooves. Each accommodating groove is used for accommodating an inspection sample. The inspection sample at least includes a specimen. The sensing device is disposed in the case on a side of the case opposite the carrying device. The sensing device senses the inspection device to generate first and second sensing signals. The control device is disposed in the case. The control device determines whether the inspection device is disposed in the correct position according to the first sensing signals, and determines whether inspection samples are placed in the accommodating grooves according to the second sensing signals to inspect the accommodating grooves placed with the inspection samples.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.