Operator guided inspection device, system, and method
US11650165B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2020 |
| Grant date | May 16, 2023 |
| Priority date | — |
| Expiry date | Apr 15, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2027/0178
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device, system, and method related to operator guided inspection is disclosed. A portable inspection device (“PID”) is comprised of a housing, display, camera, light array, gyro, location sensor, a non-transitory computer-readable medium, a processor, and a computer-executable instruction set stored on the non-transitory computer-readable medium. The method is comprised of the steps of selecting an inspection task using the PID; capturing an image of the DUT; providing a reference image with reference dimensions; fixing the focal distance on the camera; providing a region of interest (“ROI”) and an alignment region (“AR”) on the display of the PID; adjusting the lighting of the PID to match the illumination on the DUT with the illumination in the reference image; adjusting the distance between the PID and the DUT such that the DUT fits in the ROI; rotating the PID until the ROI and AR merge into a Merged Region; calibrating the Merged Region with the reference image by scaling the pixel-level distances of the Merged Region with the reference dimensions of the reference image; and performing an automated inspection routine on one or more special characteristics of the DUT. The ope…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.