Patent · US Active

Gathering and analyzing assessment data using customizable ontologies built upon a meta model

US11651849B2 · kind B2 · utility

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23Claims
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Key dates

Filing dateJul 15, 2020
Grant dateMay 16, 2023
Priority date
Expiry dateJul 1, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG16H10/20
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

A meta model may be provided as a global structure providing flexible or customizable options for a specific ontology designed by a system operator. A meta model may include generic structures, such as attributes, attribute categories, and attribute properties. A system operator may configure a set of specific attributes, attribute categories, and synthesis rules within the meta model to define a desired ontology, customizing the system to a specific purpose. A system can receive assertions about points of interest known to the system, and store information about attributes of points of interest based on the specified ontology.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.