Semiconductor devices with an electrically tunable emitter and methods for time-of-flight measurements using an electrically tunable emitter
US11652177B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2018 |
| Grant date | May 16, 2023 |
| Priority date | — |
| Expiry date | Nov 3, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S7/4865
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The semiconductor device comprises an emitter of electromagnetic radiation, a photodetector enabling a detection of electromagnetic radiation of a specific wavelength, a filter having a passband including the specific wavelength, the filter being arranged on the photodetector, the emitter and/or the filter being electrically tunable to the specific wavelength, and a circuit configured to determine a time elapsed between emission and reception of a signal that is emitted by the emitter and then received by the photodetector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.