Patent · US Active

3D measurement model and spatial calibration method based on 1D displacement sensor

US11654568B2 · kind B2 · utility

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Key dates

Filing dateMay 15, 2019
Grant dateMay 23, 2023
Priority date
Expiry dateMay 22, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A 3D measurement model and the spatial calibration method based on a 1D displacement sensor are proposed. A 3D measurement system based on a fixed 1D displacement sensor is established; then a spatial measurement model based on the 1D displacement sensor is established; and then based on the high precision pose data of the measurement plane and sensor measurement data, spatial calibration constraint equation are established; a weighted iterative algorithms is employed to calculate the extrinsic parameters of the 1D sensor that meet the precision requirements, then the calibration process is completed. A high precision 3D measurement model is established; a 3D measurement model based on a 1D displacement sensor is established, and the calibration method of the measurement model is proposed, which will improve the precision of the 3D measurement model and solve the problem of inaccurate spatial measurement caused by the errors of the sensor extrinsic parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.