High-temperature in-situ loaded computed tomography testing system based on laboratory X-ray source and method therefor
US11662282B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2021 |
| Grant date | May 30, 2023 |
| Priority date | — |
| Expiry date | Sep 20, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A high-temperature in-situ loaded computed tomography (CT) testing system based on a laboratory X-ray source and a method therefor are provided. A dynamic sealing device is adopted. A pull-up pressure rod and a pull-down pressure rod are allowed to rotate circumferentially and move axially. Meanwhile, a high-temperature furnace is fixed without rotating or moving, such that the high-temperature furnace is flat in an imaging direction to shorten an imaging distance and improve imaging quality. An independent tensile testing machine is utilized to achieve high-load loading. The in-situ measurement of internal deformation and damage information of a specimen under tensile or compressive load in a high-temperature environment is implemented. By taking advantage of the miniaturization design of the high-temperature device, the accuracy of the damage test using the laboratory X-ray source is increased. Tests and researches on the internal damage and failure behavior of the high-temperature materials can be conducted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.