Patent · US Active

System for tensile testing films

US11662283B2 · kind B2 · utility

0Cited by

4References

16Claims

0Family size

Assignee

DOW GLOBAL TECHNOLOGIES LLC · US

Inventors

Donald L. McCarty, II · Midland, US
William E. Gee · Collegeville, US
Paul OConnell · Lake Jackson, US
Jonathan J. Zieman · Midland, US
John Lund · Midland, US
Hitendra Singh · Lake Jackson, US
Scott J. Collick · Lake Jackson, US

Key dates

Filing date	Jun 8, 2018
Grant date	May 30, 2023
Priority date	—
Expiry date	Aug 31, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01N2203/0617
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.