Methods and apparatuses for detecting tamper using machine learning models
US11662698B2 · kind B2 · utility
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41References
20Claims
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Key dates
| Filing date | Jul 16, 2019 |
| Grant date | May 30, 2023 |
| Priority date | — |
| Expiry date | Aug 9, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D30/70
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present application describes a machine learning method for detecting tamper. The method includes a step of training a model using one or more values obtained from one or more different sensors on an integrated module. The one or more values act as training data with respect to one or more of light, acceleration, magnetic field, rotation, temperature, pressure, humidity, and audio. The method also includes a step of predicting, via the trained model, tampering of the of the integrated module. The present application also describes a system for detecting tamper.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.