Combining signals from multiple sensors to facilitate EMI fingerprint characterization of electronic systems
US11663369B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2020 |
| Grant date | May 30, 2023 |
| Priority date | — |
| Expiry date | Oct 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/73
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
During operation, the system uses N sensors to sample an electromagnetic interference (EMI) signal emitted by a target asset while the target asset is running a periodic workload, wherein each of the N sensors has a sensor sampling frequency f, and wherein the N sensors perform sampling operations in a round-robin ordering with phase offsets between successive samples. During the sampling operations, the system performs phase adjustments among the N sensors to maximize phase offsets between successive sensors in the round-robin ordering. Next, the system combines samples obtained through the N sensors to produce a target EMI signal having an EMI signal sampling frequency F=f×N. The system then generates a target EMI fingerprint from the target EMI signal. Finally, the system compares the target EMI fingerprint against a reference EMI fingerprint for the target asset to determine whether the target asset contains any unwanted electronic components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.