Beam alignment systems and method
US11665806B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2019 |
| Grant date | May 30, 2023 |
| Priority date | — |
| Expiry date | Dec 20, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/616
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure relates to a downhole tool that includes a first photon flux detector disposed at a first radial position about a longitudinal axis of the downhole tool that measures a first signal indicative of an x-ray flux of the x-ray photons. The downhole tool also includes a second photon flux detector disposed at a second radial position about the longitudinal axis of the downhole tool that measures a second signal indicative of the x-ray flux of the x-ray photons. Further, the downhole tool includes a controller communicatively coupled to the first photon flux detector and the second photon flux detector that determines a condition associated with the electron beam based at least in part on a relative x-ray flux from the first photon flux detector and the second photon flux detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.